Min-Hsin(Sam) Liu
Hi! Welcome to my page!
I recently completed my master’s degree at the Graduate Institute of Electronics Engineering, National Taiwan University, where I was part of the Laboratory of Dependable Systems (LaDS). My research focused on integrated circuit (IC) testing and diagnosis, aiming to improve yield and test quality. I’m now exploring PhD opportunities and am particularly interested in IC test methodologies and hardware security.
If you’d like to know more about me or my work, feel free to reach out!
NEWS
Awarded the IEEE Taipei Section 2025 Best Master’s Thesis Award
Paper accepted by 2025 International Test Conference (ITC)
Paper accepted by 2025 VLSI Test Symposium (VTS)